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Scanning Capacitance Microscopy (SCM) is a nanoelectrical imaging method on AFM systems, measuring not only differential capacitance (dC/dV) but also capacitance, which linearly correlates with dopant concentrations, simplifying data interpretation. SCM is over 20 times faster than traditional methods, enhancing productivity, and offers higher resolution imaging, revealing smaller structures.
| Brand | Oxford Instruments |
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| Color | black |
| Manufacturer | Oxford Instruments |
| Compatible Devices | Personal Computer |
| Enclosure Material | Metal |
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